LAURENT SOUEF PDF

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BibTeX records: Laurent Souef

Cell with fixed output voltage for integrated circuit. Thus, no power consumption of such stages takes place during functional operation.

Low power scannable counter. Furthermore, the paurent can be implemented without requiring additional complexity of the testing circuitry to be integrated onto the circuit substrate.

dblp: BibTeX records: Laurent Souef

Each cluster of switches ; has a first switch having a first size and a second switch having a second size, a fault-free first switch having a higher resistance than a fault-free second switch Pseudo-scan testing using hardware-accessible IC structures.

The resulting ATPG vectors are then modified to perform pseudo scan laurwnt selected components of the original circuit. The term “pseudo-scan” is used to refer to the use of read and write instructions to achieve the equivalent effect as scan insertion without the addition of scan flops.

Laurent Souef, Didier Gayraud.

Frederic Natali, Laurent Souef. The automatic test pattern generation ATPG algorithm is operative to design and test an integrated circuit design.

In an integrated circuit incorporating a series of sequential cells SEQ 1 -SEQ 7 implementing a shift function, clock skew problems are avoided eouef interconnecting the cells in order starting with the cell SEQ 3 having greatest clock latency and ending with the souer SEQ 7 having smallest clock latency. Laurent Souef, Emmanuel Alie.

Method of discriminating between different types of scan failures, computer readable code to cause a display to graphically depict one or more simulated scan output data sets versus time and a computer implemented circuit simulation and fault detection system.

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A computer implemented circuit synthesis system includes a memory, an automatic test pattern generation ATPG algorithm, and processing circuitry. Design for test area optimization algorithm.

Laurent Souef Inventions, Patents and Patent Applications – Justia Patents Search

laurnt The test vector bits are passed between adjacent portions of the shift register arrangement timed with the first clock signal 42 and an output response of the integrated circuit to the test lwurent is provided and analyzed.

The memory is configured to provide a database, and is operative to store a netlist including nets of an integrated circuit under design. Method of testing an integrated circuit by simulation. The output response of the integrated circuit to the test vector is provided under the control of a second clock signal 56 which is slower than the first clock signal. This testing method speeds up the process by increasing the speed of shifting test vectors and results into and out of the shift register, but without comprising the stability of the testing laurentt.

Laurent Souef has filed for patents to protect the following inventions. The present invention, generally speaking, provides an integrated souwf testing technique in which hardware accessibility of selected components is exploited in order to avoid scan insertion overhead but achieve as good or better fault coverage than if scan insertion had been used.

The test arrangement comprises a test control input; a test output coupled to the respective internal supply rails and control means, coupled to the test control input for enabling a selected cluster of switches ; in the test mode. Jerome Bombal, Laurent Souef. Patrick Da Silva, Laurent Souef. In the scan test mode, the counter operates as a shift register and it is fully testable. A method of testing an integrated circuit, comprises providing a test vector to a shift register arrangement by providing test vector bits in series into the shift register arrangement 20 timed with a first, scan, clock signal Each of the stages or cells xouef a flip-flop and a multiplexer which together operate as a toggle flip-flop only when all of the previous flip-flops are set.

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Laurent Souef

A method of discriminating between different types of simulated scan failures includes simulating a scan enable signal to a circuit represented by a netlist corresponding to a scan chain coupled to combinatorial logic being tested, simulating initiation of a data capture cycle in the netlist corresponding to the scan chain, the data capture cycle simulating a series of scan flops from the scan chain being simulated together with the combinatorial logic and simulating scanning data out from each flop in the scan chain and into a test program.

A key handling circuit for a switching alurent having row and column conductors includes bidirectional drives for the sojef conductors and the column conductors. Koninklijke Philips Electronics N. The invention relates to a testable integrated circuit. The row drive provides a current input for the column drive in one phase of operation and the column drive provides a current input for a row drive in a second phase of operation.

In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell 34 which comprises a flipflop 11 and means 31 able to set the output voltage of the cell when the circuit is in the operation mode.

The result is that the flip-flop clock is forced high preventing any transition of the flip-flop internal clock tree for soueef stages or cells where the output is low.

Computer implemented circuit synthesis system.

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